Central Library, Indian Institute of Technology Delhi
केंद्रीय पुस्तकालय, भारतीय प्रौद्योगिकी संस्थान दिल्ली

Non-Destructive testing: Views, reviews, previews

Egerto, H.B.

Non-Destructive testing: Views, reviews, previews - Oxford Oxford University 1969 - 233 - Harwell Post Graduate Series .


Material Testing

010

620.179.1 / EGE-N
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