Confocal microscopy / Jian Liu and Jiubin Tan.

"Version: 20161201"--Title page verso.

"A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.

Includes bibliographical references.

Preface -- 1. Confocal microscopy and its application in China -- 1.1. A brief review of confocal microscopy -- 1.2. Resolution -- 1.3. Standardization in China

2. Point spread function model -- 2.1. Lens imaging -- 2.2. PSF in confocal imaging

3. Incoherent three-dimensional optical transfer function -- 3.1. Development of 3D optical transfer function -- 3.2. 3D imaging models of CM -- 3.3. 3D-OTF of CM -- 3.4. 3D-OTF of differential

4. Decoupling criteria for three-dimensional optical microscopic measurement -- 4.1. Introduction -- 4.2. Decoupling model for the measurement of thin samples -- 4.3. Decoupling model for the measurement of a deep groove sample -- 4.4. Experiments

5. Pupil filter design -- 5.1. Phase rotation transformation -- 5.2. The design method of filters with global minimizing side lobes

6. Confocal axial peak extraction algorithm -- 6.1. Introduction -- 6.2. Centroid method for localization of confocal peak -- 6.3. Nonlinear fitting method for peak localization -- 6.4. Deviation analysis for localization of confocal axial peak

7. Differential confocal microscopy -- 7.1. Introduction -- 7.2. Application of DCM in China -- 7.3. The Basic principle of DDCM

8. Medium aided scattering measurement -- 8.1. Introduction -- 8.2. The principle of medium aided scattering confocal microscopy -- 8.3. Analysis of deposition uniformity of a fluorescent medium layer -- 8.4. Error analysis and height correction of the medium layer -- 8.5. Application of medium aided scattering confocal microscopy

9. Scanning technology -- 9.1. Introduction -- 9.2. Scanners -- 9.3. Raster scanning -- 9.4. [alpha]-[beta] circular scanning

10. Confocal profilometer -- 10.1. Introduction -- 10.2. Basic principle -- 10.3. The extraction method of discrete surface -- 10.4. Application of confocal profilometer.

The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.

Also available in print.

Mode of access: World Wide Web.

System requirements: Adobe Acrobat Reader, EPUB reader. or Kindle reader.

Jian Liu is Professor and vice dean of the School of Electrical Engineering and Automation, Harbin Institute of Technology, China, Honorary Professor at the University of Nottingham, UK. His academic interests lie in the theories and implementations of optical microscopes, in particular the development of confocal microscopes, applied optics and optical metrology. He is also council member of China Optical Society for Engineering and China Instrument and Control Society, and also a member of ISO/TC213 and China SAC/TC240, both for geometrical products specifications, and a board member of Journal of Microscopy, Surface Topography: Metrology & Properties and Optics Communications.

Title from PDF title page (viewed on January 13, 2017).