Central Library, Indian Institute of Technology Delhi
केंद्रीय पुस्तकालय, भारतीय प्रौद्योगिकी संस्थान दिल्ली

Non-Destructive testing: Views, reviews, previews

By: Egerto, H.BContributor(s): Material type: TextTextLanguage: English Series: Harwell Post Graduate SeriesPublication details: Oxford: Oxford University, 1969Description: 233Subject(s): Material TestingUDC classification: 620.179.1 LOC classification: 010
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Item type Current library Call number Status Date due Barcode
Book Book Indian Institute of Technology Delhi - Central Library
Central Library
620.179.1 EGE-N (Browse shelf(Opens below)) Missing 65835
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